High current 5V tolerant buffer using a 2.5 volt power supply

ABSTRACT

Using at best a 2.5V nominal power supply, 3.3V technology can be used to implement a 5V tolerant open drain output buffer. High voltage and/or current tolerance is achieved with only the 2.5V power supply. A p-channel FET transistor is connected between a power supply and a node, which in turn is connected to a node between two series output FET transistors. The first transistor is connected between the PAD and node, and the second transistor is connected between the node and ground. The gate of the second transistor is driven from another node formed between a series string of a p-channel FET transistor and an n-channel FET transistor. The other side of the first transistor is connected to the power supply, and the other side of the second transistor is connected to ground. The gates of the transistors of the inverter are tied together and driven by an applied signal.

BACKGROUND OF THE INVENTION

1. Field of the Invention

This invention relates generally to buffers. More particularly, itrelates to integrated circuits (ICs) including low voltage buffers,e.g., 2.5 volt buffers having high current and/or voltage tolerance.

2. Background of Related Art

In computer systems, the reduction of power usage is paramount.Initially, many computer buses (e.g., SCSI, DDR, PCI, PCMCIA, etc.) werebased on 5 volt standards. More recently, the voltage level of thosestandards has been lowered to 3.3 volts. The lower voltage providessignificant power savings, lowers capacitance between lines, and otheradvantages.

However, in lowering the voltage standard to 3.3V, many existing systemcomponents would have been rendered useless but for requirements thatthe new, lower voltage systems be backwards compatible to accommodate 5Vcomponents. Thus, system components generally powered at only 3.3Vneeded to communicate with system components that were powered at 5V.The terminology referring to this backwards compatibility for 5V legacysystems is commonly referred to as “5V tolerant” systems.

Various system components communicate with one another typically viawired lines or busses. To buffer various components, input and/or outputbuffers are typically established at the input or output of any line incommunication with the bus or lines to another system component. Manysystems have bi-directional communication lines, and bi-directionalbuffers are appropriately used.

5V tolerant, 3.3V buffers have been known. For instance, FIG. 7 shows aportion of an integrated circuit including conventional 5V tolerant opendrain buffer made with 3.3V technology MOS transistors.

In particular, as shown in FIG. 7, VDD represents the power supply, andVSS ground. An inverter formed by a series connection of a p-channelField Effect Transistor (FET) M1 and an n-channel FET transistor M2drives node N to the opposite voltage of the input signal A. An outputstage comprises a series connection of two n-channel FET transistors M3and M4. The gate of transistor M3 is connected to node N, while the gateof transistor M4 is connected to the power supply VDD.

In operation, when signal A is LOW, node N goes HIGH, turning transistorM3 ON and pulling PAD LOW, since transistor M4 is always ON. When signalA is HIGH, node N is driven LOW, turning transistor M3 OFF.

If a 5V signal is applied to PAD when signal A is HIGH, transistor M4protects transistor M3 by acting as a source-follower. Thus, when PAD isat 5V, transistor M4 does not allow node N1 to go below VDD-Vtn, whereVtn is the n-channel threshold of transistor M4. This value is typically0.8V. With a nominally 3.3V+/−10% power supply (VDD=3.3V), the voltageat node N1 cannot go below 3.0V−0.8V=2.2V. On the other hand, with amaximum voltage of 5V+10%=5.5V on PAD (high end range of a nominally5.0V power supply), this limits the drain-to-source voltage ontransistor M4 to 5.5V−2.2V=3.3V.

In the never-ending quest to lower power consumption and increase thespeed of electronic and computer systems, lower voltage standards arebeing developed, most notably a 2.5V standard. Over the years thisstandard may drop to 2.0V, and even to 1.8V. For such low voltagesystems to maintain support for and compatibility with legacy systems,it is desirable for 2.5V systems to be capable of communicating andfully operable with systems using nominal 5V and 3.3V power supplies.However, significant hurdles exist for such ultra low voltage 2.5V (andless) systems to be tolerant to 5V inputs or outputs.

For instance, while power supplies have a nominal voltage of, e.g., 5Vor 2.5V, etc., power supplies typically exhibit a tolerance in voltagevariation of +/−10%. Tight tolerances on a power supply dramaticallyincreases costs of the power supply. As in everything, there is abalance between acceptable tolerance and price. Many power supplies areconsidered acceptable with a +/−10% tolerance. Thus, even though a powersupply might be nominally rated for 2.5V, it can be as low as 2.25V.Similarly, even though a 5.0V system is nominally rated for 5.0V, it canbe as high as 5.5V.

Referring again to the conventional buffer 500 shown in FIG. 7, if VDDwere to be lowered to only 2.25V, then node N1 can go as low as2.25V−0.8V=1.45V. This generates a drain-to-source voltage on transistorM4 equal to 5.5V−1.45V=4.05V. This voltage of over 4 volts significantlyexceeds the high end technology limit of 3.63V for 3.3V technology.Thus, the transistors of the buffer 500 would be damaged if VDD were anin-spec 2.25V and an in-spec 5.5V legacy system were connected to thebuffer 500.

Current 5V tolerant buffers manufactured using 3.3V technology require a3.3V power supply to assure that no transistor sees a gate voltage ordrain-to-source voltage greater than 3.63V. There is a need for anintegrated circuit having a 5V tolerant buffer design that can bepowered with a power supply voltage significantly lower than 3.3 V,e.g., of only a 2.5V (or lower voltage).

BRIEF DESCRIPTION OF THE DRAWINGS

Features and advantages of the present invention will become apparent tothose skilled in the art from the following description with referenceto the drawings, in which:

FIGS. 1 and 2 show a portion of an integrated circuit including a highcurrent, 5V tolerant 2.5V (or lower voltage) open drain output buffer,in accordance with a first embodiment of the present invention.

FIG. 3 shows the embodiment of FIGS. 1 and 2 implemented as an opendrain bi-directional buffer.

FIG. 4 shows a backgate bias generator formed on an integrated circuit,and

FIG. 5 shows an example of a more moderate current, 5V tolerant 2.5V (orlower voltage) open drain output buffer utilizing the backgate biasgenerator, in accordance with another embodiment of the presentinvention.

FIG. 6 shows an integrated circuit including the embodiment of FIGS. 4and 5 implemented as an open drain bi-directional buffer.

FIG. 7 shows an integrated circuit including a conventional 5V tolerantopen drain buffer made with 3.3V technology MOS transistors.

SUMMARY OF THE INVENTION

In accordance with the principles of the present invention, a highcurrent, 5V tolerant buffer for operation at 2.5V or less, comprises aninverter connected between a power supply voltage and ground. A seriesconnection of transistors are between a PAD input and ground. An outputof the inverter is input to a gate of one of the series connection oftransistors. A gate of another of the series connection of transistorsis connected to the power supply voltage, with a node N1 being formedbetween the series connection of transistors. A p-channel transistor isbetween the power supply and the node N1. Typically the buffer ismanufactured as part of an IC, though it could alternatively bemanufactured as separate components.

In accordance with another aspect of the present invention, a method ofproviding 5V tolerance to an output buffer operating at low voltagecomprises providing an inverter connected between a power supply voltageand ground. A series current path connection of a plurality oftransistors is provided between a PAD input and ground. An output of theinverter is input to a gate of one of the series connection oftransistors. A gate of another of the series connection of transistorsis connected to the power supply voltage, with a node N1 being formedbetween the series connection of transistors. A p-channel transistor isprovided between the input from the power supply and the node N1. Apower supply of no more than 2.5V nominal would be coupled to the outputbuffer.

DETAILED DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS

The embodiments of the present invention are designed for use with apower supply of a 2.5V nominal power supply. Nominal as used hereinrelates to the acknowledgement that actual power varies within areasonable tolerance, e.g., most often +/10%. Thus, a nominal 2.5V powersupply may actually produce anywhere between 2.25V and 2.75V. Thedisclosed embodiments are equally applicable for operation with voltagesupplies as low as 2.0V nominal, and possibly as low as 1.8V nominal.

Some buffers are required to tolerate an input voltage greater than thatallowed by the particular semiconductor technology. For instance,circuits that allow a 3.3V technology to tolerate a 5V signal applied tothe buffer's pad have long been known. However, such circuits require apower supply of 3.3V to tolerate the 5V signal. The circuitry andmethods described herein provide similar high voltage/current toleranceto be achieved with only a 2.5V power supply.

In a first embodiment, the buffer is determined to be area efficient forsink currents greater than about 30–40 mA. In a second embodiment, thebuffer is determined to be area efficient for sink currents less thanabout 24 mA.

In all disclosed embodiments, the buffer (input, output, orbi-directional buffer) is an open drain buffer. It will be understood bythose of ordinary skill in the art that the circuit described herein toprovide an improved open drain buffer can also be used in the pull-downportion of a push-pull buffer.

FIGS. 1 and 2 show a portion of an integrated circuit including a 5Vtolerant 2.5V (or lower voltage) open drain output buffer, in accordancewith a first embodiment of the present invention.

In particular, as shown in FIG. 1, a comparator 102 is used to generatean indicator signal NORM as to whether the signal on a particular signalline input is at the same voltage level as the buffer, or is higher(e.g., 5V) and thus requiring legacy backwards compatibility in thebuffer. The comparator 102 has the power supply VDD of the buffer inputinto its non-inverting input (+), and a voltage level of the relevantinput at the inverting input (−). The comparator 102 evaluates thedifference in voltages between the power supply voltage VDD, and thevoltage level of the relevant PAD. If VDD is greater than or essentiallyequal to PAD, then the legacy present signal NORM is driven HIGH by thecomparator 102. On the other hand, if VDD is less than PAD, as is thecase when 5V is applied to the PAD, then the legacy present signal NORMis driven LOW. It will be appreciated by those of ordinary skill in theart that the opposite signal levels may alternatively be implemented,i.e., with the legacy present signal NORM being driven HIGH if PAD isgreater than VDD.

Appropriate hysteresis may be implemented in the comparator 102 to avoidoscillation when the PAD voltage is essentially the same as VDD.

FIG. 2 shows how the legacy present signal NORM may be utilized toinstigate 5V tolerance in the output buffer 100, which uses a nominalpower supply of VDD=2.5V in the disclosed embodiments.

In particular, as shown in FIG. 2, a p-channel FET transistor M5 has itscurrent path connected between a power supply voltage VDD and a node N1.The node N1 is connected to a node between two series coupled output FETtransistors M3 and M4. The current path of transistor M4 is connectedbetween the PAD and node N1, and the current path of transistor M3 isconnected between the node N1 and VSS, which is typically at groundpotential.

The gate of the second transistor M3 is driven from a node N, formedbetween the series current path of a p-channel FET transistor M1 and ann-channel FET transistor M2. The other side of the current path oftransistor M1 is connected VDD, which is typically at power supplypotential, and the other side of the current path of transistor M2 isconnected to VSS. The gates of the transistors M1, M2 are tied togetherforming node A, and are driven by a signal applied thereto.

In operation, when a 5V signal is applied to PAD, indicating that alegacy device is present and connected to the buffer 100, the legacypresent signal NORM is driven low, turning transistor M5 ON. Thisconnects node N1 to the power supply VDD electrically, and ensures thatthe minimum voltage at node N1 is VDD. Thus, the drain-to-source voltageon transistor M4 becomes limited to a maximum value of 5.5V−2.25V=3.25V.On the other hand, when PAD is less than (or essentially equal to) the2.5V power supply VDD, the legacy present signal NORM is driven HIGH,turning transistor M5 OFF.

However, transistors M3 and M4, no matter how large, are not sufficientto protect the buffer 100, particularly from the damaging effects of anelectro-static discharge (ESD) event. Transistors provided for ESDprotection are large transistors, which are typically made from manysmaller transistors connected in parallel, must have node N1 wired incommon for the circuit of FIG. 2 to operate. However, this allows an ESDevent to go through a single one of the small transistors, which canresult in damage to that transistor. Therefore, in addition totransistors M3 and M4, another group of current path-series connectedtransistors whose mid-point is not wired out to any node, should beadded. The width of the channels of each of these ESD protectiontransistors is typically 400–500 micrometers (uM). Therefore, it may notbe area efficient to use the buffer 100 shown in FIG. 2 unless thecurrent sinking requirement of the buffer makes it so large that the useof two series connected transistors is a real area savings over thatrequired by three series connected transistors. This is the case formany current applications, e.g., a SCSI application requiring, e.g., 48mA sink current.

FIG. 3 shows the embodiment of FIGS. 1 and 2 implemented as an opendrain bi-directional buffer.

In particular, as shown in FIG. 3, an input stage 150 may be added toreceive the signal input at the PAD via transistor M4. The input stage150 provides an output signal Z to the other portions of the integratedcircuit on which the buffer is fabricated.

The buffer 100 shown in FIGS. 1–3 allows 5V tolerance to be achieved inthe commercial market, e.g., with an AL13 process such as is used byMAXTOR™, and with similar 3.3V processes, when the operating powersupply is nominally only 2.5V or even less, e.g., 2.0V. It is areaefficient for sink currents over about 30–40 mA.

In the case of more moderate requirements, another embodiment of thepresent invention is disclosed wherein an open drain buffer capable of16 mA, is 5V tolerant in a 3.3V process technology, and is operated withonly a nominal power supply of only 2.5V.

FIG. 4 shows a backgate bias generator, and FIG. 5 shows an example of amore moderate current, 5V tolerant 2.5V (or lower voltage) open drainoutput buffer utilizing the backgate bias generator, in accordance withanother embodiment of the present invention.

In particular, FIG. 4 shows, as a part of an integrated circuit, abackgate bias generator 300 that uses two p-channel FET transistors MB1,MB2 with series connected current paths between VDD and the PAD. Thebackgate of both transistors MB1, MB2 is connected to node BIAS toensure that the parasitic diodes associated with p-channel devices arealways reverse biased.

The gates are cross-connected with the gate of transistor MB1 beingcoupled to the PAD, and the gate of transistor MB2 being coupled to VDD.When the PAD voltage is lower than VDD, transistor MB1 is turned ON andMB2 is turned OFF. Under this condition, node BIAS is equal to VDD.

When the PAD voltage is greater than VDD, MB1 is turned OFF and MB2 isturned ON. This connects node BIAS to the PAD.

FIG. 5 shows an exemplary 5V tolerant open drain output buffer utilizingthe backgate bias generator 300 shown in FIG. 4, in accordance withanother embodiment of the present invention.

In particular, the bias generator 300 of FIG. 4 is used to make thebuffer 400 shown in FIG. 5 5V tolerant with a power supply VDD that isnominally only 2.5V (or even less, to about 2.0V).

The buffer 400 (e.g., output buffer) utilizes the same design for FETtransistors M1, M2, M3 and M4 as shown and described with respect toFIGS. 1 and 2. However, the p-channel transistor M5 shown in FIG. 2 isnot used, but instead an n-channel FET transistor M6 is added to the topof the series current path connection of transistors M4 and M3, suchthat there is a series current path connection of transistors M6, M4 andM3. The other side of the current path of transistor M6 is connected tothe PAD, while the gate of transistor M6 is connected to the BIAS signalgenerated by the backgate bias generator 300 shown in FIG. 4.

The circuit of FIGS. 4 and 5 operates as follows. When signal A is LOW,node N is driven HIGH, transistors M3, M4 and M6 are turned ON, and thePAD is pulled LOW.

On the other hand, when signal A is HIGH, node N is driven LOW andtransistor M3 is turned OFF. At that point, if a 5V level from a legacysystem connected to the buffer 400 is applied to PAD, the BIAS signalwill also be at 5V. Under these conditions, node N2 will be at athreshold voltage below the voltage level of PAD. For instance, themaximum voltage of node N2, considering an upper range of a nominal 5.0Vsource to be 5.5V (5.0V×10%=5.5V), and thus a 5.5V PAD signal, would be5.5V−0.8V=4.7V.

At the low end of the nominal power supply voltage scale of 10% downfrom its nominal rating of 2.5V, or VDD=2.25V, then the minimum voltageat the node N1 will be 2.25V−0.8V=1.45V. In this scenario, thedrain-to-source voltage across transistor M6 is 0.8V, and acrosstransistor M4 is 3.25V.

FIG. 6 shows the embodiment of FIGS. 4 and 5 implemented as an opendrain bi-directional buffer.

In particular, as shown in FIG. 6, an input stage 150 may be added toreceive the signal input at the PAD via transistor M4. The input stage150 provides an output signal Z to the other portions of the integratedcircuit on which the buffer is fabricated.

The use of three series n-channel FET transistors M3, M4, M6 as shown inthe exemplary embodiment of FIGS. 4–6 requires that each transistor be50% larger than would be the case for a buffer with only two transistorsin series. However, for ESD reasons, the minimum recommended size of thewidth of the channels of each of these transistors is 400–500 um. Thelength of the channels of each of the FET transistors is typicallydictated by the minimum channel length permitted by the relevanttechnology. The desired channel width for each of the three seriestransistors M3, M4, M6 to sink 16 mA is 450 um, to minimize or eliminatealtogether circuit area waste.

The embodiment of FIGS. 4–6 of the present invention allows 5V toleranceto be achieved with 3.3V processes, when the power supply is nominallyonly 2.5V, or even less, e.g., only 1.8V. This embodiment is areaefficient for sink currents below about 24 mA.

While the invention has been described with reference to the exemplaryembodiments thereof, those skilled in the art will be able to makevarious modifications to the described embodiments of the inventionwithout departing from the true spirit and scope of the invention.

1. A high current, 5V tolerant buffer for operation at 2.5V or less, comprising: an inverter connected between a power supply voltage and ground; a series connection of transistors between a PAD input and ground, an output of said inverter being input to a gate of one of said series connection of transistors, a gate of another of said series connection of transistors being connected to said power supply voltage, with a node N1 being formed between said series connection of transistors; and a p-channel transistor between said power supply and said node N1.
 2. The high current, 5V tolerant buffer for operation at 2.5V or less according to claim 1, further comprising: a comparator outputting a comparison between said power supply voltage and said PAD input voltage, an output of said comparator driving a gate of said p-channel transistor.
 3. The high current, 5V tolerant buffer for operation at 2.5V or less according to claim 1, wherein: said inverter comprises a series connection of a p-channel FET transistor and an n-channel FET transistor.
 4. The high current, 5V tolerant buffer for operation at 2.5V or less according to claim 1, further comprising: an input stage connected to said N1; wherein said buffer is a bi-directional buffer.
 5. The high current, 5V tolerant buffer for operation at 2.5V or less according to claim 1, wherein: said buffer operates with a nominal power supply of 2.0V.
 6. The high current, 5V tolerant buffer for operation at 2.5V or less according to claim 1, wherein: said buffer operates with a nominal power supply of 1.8V.
 7. The high current, 5V tolerant buffer for operation at 2.5V or less according to claim 1, further comprising: a SCSI bus interface circuit connected to said buffer.
 8. The high current, 5V tolerant buffer for operation at 2.5V or less according to claim 1, further comprising: a PCI bus interface circuit connected to said buffer.
 9. The high current, 5V tolerant buffer for operation at 2.5V or less according to claim 1, further comprising: a PCMCIA bus interface circuit connected to said buffer.
 10. The high current, 5V tolerant buffer for operation at 2.5V or less according to claim 1, wherein: said buffer can sink at least 48 mA of current.
 11. A method of providing 5V tolerance to an output buffer operating at low voltage, comprising: providing an inverter connected between a power supply voltage and ground; providing a series connection of transistors between a PAD input and ground, an output of said inverter being input to a gate of one of said series connection of transistors, a gate of another of said series connection of transistors being connected to said power supply voltage, with a node N1 being formed between said series connection of transistors; providing a p-channel transistor between said power supply and said node N1; and providing a power supply of no more than 2.5V nominal to said output buffer.
 12. The method of providing 5V tolerance to an output buffer operating at low voltage according to claim 11, further comprising: providing an input stage connected to said buffer, said input stage having an input connected to said node N1; wherein said buffer is a bi-directional buffer.
 13. The method of providing 5V tolerance to an output buffer operating at low voltage according to claim 11, further comprising: inputting a comparison between said power supply voltage and said PAD input voltage as an input to a gate of said p-channel transistor.
 14. The method of providing 5V tolerance to an output buffer operating at low voltage according to claim 11, wherein said step of providing a power supply comprises: providing a nominal power supply of 2.0V.
 15. The method of providing 5V tolerance to an output buffer operating at low voltage according to claim 11, wherein said step of providing a power supply comprises: providing a nominal power supply of 1.8V.
 16. The method of providing 5V tolerance to an output buffer operating at low voltage according to claim 11, wherein: said buffer can sink at least 48 mA of current.
 17. Apparatus for providing 5V tolerance to an output buffer operating at low voltage, comprising: means for providing an inverter connected between a power supply voltage and ground; means for providing a series connection of transistors between a PAD input and ground, an output of said inverter being input to a gate of one of said series connection of transistors, a gate of another of said series connection of transistors being connected to said power supply voltage, with a node N1 being formed between said series connection of transistors; means for providing a p-channel transistor between said power supply and said node N1; and means for providing a power supply of no more than 2.5V nominal to said output buffer.
 18. The apparatus for providing 5V tolerance to an output buffer operating at low voltage according to claim 17, further comprising: means for inputting a comparison between said power supply voltage and said PAD input voltage as an input to a gate of said p-channel transistor.
 19. The apparatus for providing 5V tolerance to an output buffer operating at low voltage according to claim 17, wherein: means for providing a power supply provides a nominal power supply of 1.8V.
 20. The apparatus for providing 5V tolerance to an output buffer operating at low voltage according to claim 17, wherein: said buffer can sink at least 48 mA of current. 